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Thermoelectric and thermal transport properties of complex oxide thin films, heterostructures and superlattices

Published online by Cambridge University Press:  14 November 2016

Jayakanth Ravichandran*
Affiliation:
Mork Family Department of Chemical Engineering and Materials Science, University of Southern California, Los Angeles, CA 90089, USA
*
a) Address all correspondence to this author. e-mail: jayakanr@usc.edu

Abstract

Over the years, the search for high performance thermoelectric materials has been dictated by the “phonon glass and electron crystal (PGEC)” paradigm, which suggests that low band gap semiconductors with high atomic number elements and high carrier mobility are the ideal materials to achieve high thermoelectric figure of merit. Complex oxides provide alternative mechanisms such as large density of states and strong electron correlation for high thermoelectric efficiency, albeit having low carrier mobility. Due to vast structural and chemical flexibility, they provide a fertile playground to design high efficiency thermoelectric materials. Further, developments in oxide thin film growth methods have enabled synthesis of high quality, atomically precise low dimensional structures such as heterostructures and superlattices. These materials and structures act as excellent model systems to explore nanoscale thermal and thermoelectric transport, which will not only expand the frontier of our knowledge, but also continue to enable cutting edge applications.

Information

Type
JMR Early Career Scholars in Materials Science Annual Issue: Reviews
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted re-use, distribution, and reproduction in any medium, provided the original work is properly cited.
Copyright
Copyright © Materials Research Society 2016
Figure 0

FIG. 1. A schematic showing the scientific and technological advantages of complex oxides as thermoelectrics: The bottom left shows how the interplay between different degrees of freedom (spin, charge, lattice, and orbit) enables new possibilities for complex oxide thermoelectrics; the top left shows the structural and chemical diversity, which affects the chemistry of complex oxides and their thermoelectric properties; the top right shows the advantages of complex oxides as materials system for any technological application; the bottom right shows the important applications, where complex oxide thermoelectrics, especially thin films can find an important role.

Figure 1

FIG. 2. Representation of thermoelectric parameters using band theory: (a) the evolution of density of states, differential electrical conductivity, and first order moment of differential electrical conductivity (x-axis) with energy. This schematic clearly distinguishes the thermoelectric properties of semiconductors and metals. (b) The dependence of thermoelectric properties on the carrier concentration. Neither semiconductors nor metals show high power factor due to too low conductivity and thermopower respectively, but the maximum occurs at intermediate carrier density, which corresponds to heavily doped (alloyed) semiconductors. The bottom panel shows that at high carrier density (metallic limit) the electronic thermal conductivity has an important contribution to the total thermal conductivity. This interplay between the three thermoelectric parameters (electrical and thermal conductivity, and thermopower) gives rise to an optical carrier density, which shows maximum power factor.

Figure 2

FIG. 3. (a) Doping dependence of thermoelectric power factor in NaxCoO2. The material is a band insulator for ρ = 0.2, and a Mott insulator for ρ = 1. The maximum obtained at ρ = 0.88 agrees well with experimental results. Reprinted from Ref. 22 with the permission of AIP Publishing. (b) The calculated total degeneracy (spin + orbital) for cobaltates depending on their valence and spin configurations. The electronic configuration is shown for each case. Reprinted figure with permission from Ref. 24. Copyright (2000) by the American Physical Society.

Figure 3

FIG. 4. (A) The evolution of 002 film peak for different La doping of “double doped” STO in a θ–2θ scan; the inset shows the rocking curve for the film and substrate. Reprinted figure with permission from Ref. 101. Copyright (2010) by the American Physical Society. (B) The (left) θ–2θ scan and (right) ϕ scans for STO thin films on LAO with various dopants (Pr, La, La & Nb, and Pr & Nb). Reproduced from Ref. 114 with permission of The Royal Society of Chemistry. (C) The evolution of 002 film peak for different growth pressures for “double doped” STO with fixed La doping in a θ–2θ scan. Reproduced from Ref. 126 with permission of Wiley Materials. (D) The reciprocal space map for 1 at% La doped STO film on LSAT substrate. Reprinted from Ref. 118 with the permission of AIP Publishing. (E) The reciprocal space map for various alloy compositions of Nb doped CaTiO3–SrTiO3–BaTiO3 system. Reprinted from Ref. 117 with the permission of AIP Publishing.

Figure 4

FIG. 5. (A) Scanning transmission electron micrograph of STO thin films with different stoichiometries [(a and b) strontium deficient, (c) stoichiometric, (d and e) strontium excess]. Reprinted from Ref. 124 with the permission of AIP Publishing. (B) Rutherford backscattering spectra for STO thin films with different levels of (non)stoichiometry. Reprinted with permission from Ref. 125. Copyright (2012) American Chemical Society. (C) Atomic force micrograph and (inset) typical reflection high energy electron diffraction pattern for the (Ca, Sr, Ba)Ti0.8Nb0.2O3 thin films. Reprinted from Ref. 117 with the permission of AIP Publishing. (D) The optical reflectivity curves for “double doped” STO with fixed La doping. Reproduced from Ref. 126 with permission of Wiley Materials.

Figure 5

FIG. 6. (A) (Top panel) XRD pattern and ϕ-scan for β-NaxCoO2 thin films. (Bottom panel) XRD pattern and ϕ-scan for γ-NaxCoO2 thin films. Reprinted from Ref. 137 with the permission of AIP Publishing. (B) XRD pattern, pole figure scan, and rocking curve (inset) for Bi2Sr2Co2Oy films on YSZ substrate. Reprinted figure with permission from Ref. 143. Copyright (2012) by the American Physical Society. (C) TEM images of Bi2Sr2Co2Oy films grown on (a) STO (001), (b) STO (110), and (c) STO (111). Reprinted from Ref. 150, with permission from Elsevier.

Figure 6

FIG. 7. Thermoelectric properties of “double doped” STO films. (A) Electrical resistivity, (B) thermopower, (C) thermal conductivity, and derived (D) power factor, and (E) ZT for “double doped” STO films over a temperature range of 300–900 K. (F) The evolution of thermopower with carrier density at room temperature and its comparison with the reported values in the literature. Reprinted figure with permission from Ref. 101. Copyright (2010) by the American Physical Society.

Figure 7

FIG. 8. Low temperature (a) electrical resistivity and (b) thermopower of PLD grown NaxCoO2 thin films. Reproduced with permission from Ref. 134. High temperature (c) electrical resistivity and (d) thermopower of Bi2Sr2Co2Oy thin films. Reprinted from Ref. 142, with permission from Elsevier.

Figure 8

FIG. 9. (A) Comparison of thermopower in bulk and quantum confined superlattices of Nb:SrTiO3/SrTiO3. Reprinted with permission from Macmillan Publishers Ltd: Nature Materials (Ref. 108), copyright (2007). (B) Thermoelectric properties of bulk and low dimensional (2D) thermoelectric oxides. (a) Thermopower and (b) power factor as a function of carrier density for bulk samples (empty squares) and fractional superlattices (filled circles). Reproduced from Ref. 171 with permission of Wiley Materials. (C) Seebeck coefficient as a function of gate voltage measured in a LAO/STO heterostructure at 4.2 K. The plot clearly shows giant oscillations in the Seebeck coefficient upon tuning of carrier density. Reproduced from Ref. 175 with permission from Nature Publication Group. (D) Seebeck coefficient measured as a function of temperature for LAO/STO samples with different carrier density. The large “phonon drag” peak is evident at low temperatures. Reprinted figure with permission from Ref. 176. Copyright (2016) by the American Physical Society.

Figure 9

FIG. 10. (a) Evolution of (top) sheet carrier density and Hall mobility, and (bottom) thermopower and resistivity for Bi2Sr2Co2Oy thin films as a function of film thickness. The mobility has a linear fit, and the resistivity and thermopower values are fit using a surface scattering model. (b) Low temperature thermopower for Bi2Sr2Co2Oy thin films with different thicknesses. (Inset) Magnetic field dependent thermopower and the fit for spin entropy model. (c) The temperature dependent resistivity for Bi2Sr2Co2Oy thin films with different thicknesses. Reprinted figure with permission from Ref. 143. Copyright (2012) by the American Physical Society.

Figure 10

FIG. 11. Measured thermal conductivity values for (a) SrTiO3/CaTiO3 and (b) SrTiO3/BaTiO3 superlattices as a function of interface density at room temperature. (c) Temperature dependence of measured thermal conductivity values for SrTiO3/CaTiO3 superlattices as a function of interface density. Reprinted with permission from Nature Publication Group (Nature Materials) (Ref. 111), copyright (2014).