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RETRACTED–Electron-driven engineering of graphene

Published online by Cambridge University Press:  15 October 2013

Mark H. Rümmeli ,
Alicja Bachmatiuk ,
Young Hee Lee  and
Juergen Eckert
Mark H. Rümmeli*
Affiliation:
Center for Integrated Nanostructure Physics (CINAP) IBS, Daejon 305-701, Republic of Korea; and Department of Energy Science, Department of Physics, Sungkyunkwan University, Suwon 440-746, Republic of Korea
Alicja Bachmatiuk*
Affiliation:
Center for Integrated Nanostructure Physics (CINAP) IBS, Daejon 305-701, Republic of Korea; Department of Energy Science, Department of Physics, Sungkyunkwan University, Suwon 440-746, Republic of Korea; and IFW Dresden, Institute of Complex Materials, 01069 Dresden, Germany
Young Hee Lee*
Affiliation:
Center for Integrated Nanostructure Physics (CINAP) IBS, Daejon 305-701, Republic of Korea; and Department of Energy Science, Department of Physics, Sungkyunkwan University, Suwon 440-746, Republic of Korea
Juergen Eckert*
Affiliation:
IFW Dresden, Institute of Complex Materials, 01069 Dresden, Germany; and TU Dresden, Institute of Materials Science, 01062 Dresden, Germany
*
a) Address all correspondence to these authors. e-mail: mhr1@skku.edu
b) e-mail: a.bachmatiuk@ifw-dresden.de
c) e-mail: leeyoung@skku.edu
d) e-mail: j.eckert@ifw-dresden.de
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Abstract

Electron microscopes are proving themselves indispensible tools in the world of nanotechnology. In this brief overview, we explore the potential of electrons within in situ transmission electron microscopy (TEM) with the electrons provided either from the imaging electron beam or from electrical currents across contacted specimens to nanoengineered graphene based on work at our labs. The use of electrons is demonstrated to be enormously versatile to pattern, heal, and even fabricate graphene. In essence, electrons provide a useful engineering tool box that with further development will enable device fabrication and modification inside a TEM, thus allowing one to study structure–property relationships of graphene as well as other low dimensional materials in near real time with atomic precision.

Keywords

nanostructuretransmission electron microscopy (TEM)electron irradiation

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Articles
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Journal of Materials Research , First View , pp. 1 - 7
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Copyright
Copyright © Materials Research Society 2013 

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References

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