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Submicron-scale detection of microbes and smectite from the interior of a Mars-analogue basalt sample by optical-photothermal infrared spectroscopy

Published online by Cambridge University Press:  19 February 2025

Yohey Suzuki*
Affiliation:
Department of Earth and Planetary Science, Graduate School of Science, The University of Tokyo, Tokyo, Japan
Mariko Koduka
Affiliation:
Department of Earth and Planetary Science, Graduate School of Science, The University of Tokyo, Tokyo, Japan
Frank E. Brenker
Affiliation:
Department of Geoscience, Goethe University, Frankfurt, Germany Schwiete Cosmochemistry Laboratory, Department of Geoscience, Goethe University, Frankfurt, Germany
Tim Brooks
Affiliation:
Rare & Imported Pathogens Laboratory, UK Health Security Agency, Porton Down, Salisbury SP4 0JG, UK
Mihaela Glamoclija
Affiliation:
Department of Earth and Environmental Sciences, Rutgers University, Newark, NJ, USA
Heather V. Graham
Affiliation:
NASA Goddard Space Flight Center, Astrochemistry Laboratory, Greenbelt, MD, USA
Thomas L. Kieft
Affiliation:
Biology Department, New Mexico Institute of Mining and Technology, Socorro, NM, USA
Francis M. McCubbin
Affiliation:
Astromaterials Research & Exploration Science Division, NASA Johnson Space Center, Houston, TX 77058, USA
Mark A. Sephton
Affiliation:
Department of Earth Science & Engineering, Imperial College London, London, UK
Mark A. van Zuilen
Affiliation:
CNRS-UMR6538 Laboratoire Geo-Ocean, Institut Universitaire Européen de la Mer, Université de Bretagne Occidentale, Plouzané, France
*
Corresponding author: Yohey Suzuki; Email: yohey-suzuki@eps.s.u-tokyo.ac.jp
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Abstract

For near-future missions planed for Mars Sample Return (MSR), an international working group organized by the Committee on Space Research (COSPAR) developed the sample safety assessment framework (SSAF). For the SSAF, analytical instruments were selected by taking the practical limitations of hosting them within a facility with the highest level of biosafety precautions (biosafety level 4) and the precious nature of returned samples into account. To prepare for MSR, analytical instruments of high sensitivity need to be tested on effective Mars analogue materials. As an analogue material, we selected a rock core of basalt, a prominent rock type on the Martian surface. Two basalt samples with aqueous alteration cached in Jezero crater by the Perseverance rover are planned to be returned to Earth. Our previously published analytical procedures using destructive but spatially sensitive instruments such as nanoscale secondary ion mass spectrometry (NanoSIMS) and transmission electron microscopy coupled to energy-dispersive spectroscopy revealed microbial colonization at clay-filled fractures. With an aim to test the capability of an analytical instrument listed in SSAF, we now extend that work to conventional Fourier transform infrared (FT-IR) microscopy with a spatial resolution of 10 μm. Although Fe-rich smectite called nontronite was identified after crushing some portion of the rock core sample into powder, the application of conventional FT-IR microscopy is limited to a sample thickness of <30 μm. In order to obtain IR-based spectra without destructive preparation, a new technique called optical-photothermal infrared (O-PTIR) spectroscopy with a spatial resolution of 0.5 μm was applied to a 100 μm thick section of the rock core. By O-PTIR spectroscopic analysis of the clay-filled fracture, we obtained in-situ spectra diagnostic to microbial cells, consistent with our previously published data obtained by NanoSIMS. In addition, nontronite identification was also possible by O-PTIR spectroscopic analysis. From these results, O-PTIR spectroscopy is suggested be superior to deep ultraviolet fluorescence microscopy/μ-Raman spectroscopy, particularly for smectite identification. A simultaneous acquisition of the spatial distribution of structural motifs associated with biomolecules and smectites is critical for distinguishing biological material in samples as well as characterizing an abiotic background.

Information

Type
Research Article
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted re-use, distribution and reproduction, provided the original article is properly cited.
Copyright
Copyright © The University of Tokyo, 2025. Published by Cambridge University Press
Figure 0

Figure 1. FT-IR microscopy spectra from smectite references and the clay fraction of the rock core. Peak attributions are described in the text.

Figure 1

Figure 2. Photographs of a nontronite-bearing fracture in the thin section from the rock core interior (a–c) with increasing magnification. Intensity maps of optical photothermal infrared (O-PTIR) spectra in a region highlighted with a yellow square in Fig. 2c at 1000 cm−1 (d) and 1530 cm−1(e). O-PTIR spectra from duplicate analyses of pink points in Fig.. 2(c)–(e), co-cultured cells of Nanoarchaeota strain MJ1 and Metallosphaera sp. strain MJ1HA (JCM33617) and cultured cells of Escherichia coli (NBRC13168) and LR White resin (f). Peak assignment was based on Movasaghi et al. (2008) and Ellerbrock et al. (2022) and references therein.

Figure 2

Figure 3. Duplicate optical photothermal infrared (O-PTIR) spectra of light blue points in Fig. 2(c)–(e) and smectite references. Peak attributions are described in the text.

Figure 3

Figure 4. Raman spectra from light blue and pink points shown in Fig 2(c)–(e) and cultured cells of Escherichia coli (NBRC13168).

Figure 4

Figure 5. Comparison of analytical data between NanoSIMS (upper) and O-PTIR (lower) (a) and between TEM-EDS (upper) and O-PITR (lower) (b). Rock characterization procedures performed in our previous and present studies (c). NanoSIMS and TEM-EDS data are modified from Suzuki et al. (2020) and Yamashita et al. (2019), respectively. SEM, scanning electron microscopy; EDS, energy-dispersive x-ray spectroscopy; FIB, focused ion beam; TEM, transmission electron microscopy; NanoSIMS, nanoscale secondary ion mass spectrometry; O-PTIR, optical-photothermal infrared.