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Preparation of hexagonal cerium oxide nanoflakes by a surfactant-free route and its optical property

Published online by Cambridge University Press:  31 January 2011

X. Yu*
Affiliation:
Department of Chemistry, Shanghai Normal University, Shanghai 200234, People’s Republic of China
P. Ye
Affiliation:
Department of Chemistry, Shanghai Normal University, Shanghai 200234, People’s Republic of China
L. Yang
Affiliation:
Department of Chemistry, Shanghai Normal University, Shanghai 200234, People’s Republic of China
S. Yang
Affiliation:
Department of Chemistry, Shanghai Normal University, Shanghai 200234, People’s Republic of China
P. Zhou
Affiliation:
Department of Chemistry, Shanghai Normal University, Shanghai 200234, People’s Republic of China
W. Gao
Affiliation:
Department of Chemistry, Shanghai Normal University, Shanghai 200234, People’s Republic of China
*
a)Address all correspondence to this author. e-mail: xibinyr@shnu.edu.cn
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Abstract

Hexagonal cerium oxide nanoflakes have been synthesized by using a surfactant-free route. Transmission electcron microscopy (TEM), x-ray diffraction (XRD), infrared spectroscopy (FTIR), thermogravimetric and differential thermal analysis (TG-DTA), Brunauer–Emmett–Teller adsorption isotherm (BET), photoluminescence (PL), and ultraviolet–visible (UV–VIS) were used to characterize the sample. The mean size of the nanoflakes is about 30 nm and the specific surface is about 70.08 m2·g−1 when annealed at 400 °C. The acidity and superfluous NH4NO3 play a key role on the formation of nanoflakes in which there exists Ce (IV) and very little Ce (III). The nanoflakes exhibit a wide PL emission peak among 350–400 nm, strong absorption ranged from 200–450 nm, and strong reflection in the visible region. As the sizes of as-prepared samples decrease, a clear blue shift in the absorbing edge is observed. The linear relationship between ΔEg and D is shown in a log–log plot. The as-prepared cerium oxide nanoflakes can be widely used as UV absorbent and polishing materials.

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Copyright
Copyright © Materials Research Society 2007

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