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Understanding plasticity in irradiated alloys through TEM in situ compression pillar tests

Published online by Cambridge University Press:  22 October 2019

Haozheng J. Qu
Affiliation:
School of Industrial Engineering, Purdue University, West Lafayette, Indiana 47906, USA
Kayla H. Yano
Affiliation:
School of Materials Engineering, Purdue University, West Lafayette, Indiana 47906, USA
Priyam V. Patki
Affiliation:
School of Materials Engineering, Purdue University, West Lafayette, Indiana 47906, USA
Matthew J. Swenson
Affiliation:
Department of Mechanical Engineering, University of Idaho, Idaho 83844, USA
Janelle P. Wharry*
Affiliation:
School of Nuclear Engineering, Purdue University, West Lafayette, Indiana 47906, USA; and School of Materials Engineering, Purdue University, West Lafayette, Indiana 47906, USA
*
a)Address all correspondence to this author. e-mail: jwharry@purdue.edu

Abstract

Depth-sensing transmission electron microscopic (TEM) in situ mechanical testing has become widely utilized for understanding deformation in irradiated materials. Until now, compression pillars have primarily been used to study the elastic properties and yield of irradiated materials. In this study, we utilize TEM in situ compression pillars to investigate plastic deformation in two ion-irradiated alloys: Fe–9% Cr oxide dispersion strengthened (ODS) alloy and nanocrystalline Cu–24% Ta. We develop an algorithm to automate the extraction of instantaneous pillar dimensions from TEM videos, which we use to calculate true stress–strain curves and strain hardening exponents. True stress–strain curves reveal intermitted plastic flow in all specimen conditions. In the Fe–9% Cr ODS, intermitted plastic flow is linked to strain bursts observed in TEM videos. Low strain hardening or strain softening is observed in all specimen conditions. TEM videos link the strain softening in irradiated Fe–9% Cr ODS to dislocation cross-slip, and in Cu–24% Ta to grain boundary sliding.

Information

Type
Article
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted re-use, distribution, and reproduction in any medium, provided the original work is properly cited.
Copyright
Copyright © Materials Research Society 2019
Figure 0

Figure 1: Representative engineering (dashed) and true (solid) stress–strain curves from (a) as-received, (b) 3 dpa, and (c) 100 dpa Fe–9% Cr ODS micropillars.

Figure 1

Figure 2: Representative engineering (dashed) and true (solid) stress–strain curves from (a) as-received and (b) 1 dpa Cu–24% Ta micropillars.

Figure 2

Figure 3: Strain hardening exponent as a function of strain rate for (a) ODS and (b) Cu–24% Ta, and as a function of minimum pillar dimension for (c) ODS and (d) Cu–24% Ta.

Figure 3

Figure 4: Still-frames from TEM in situ compression pillar test on as-received Fe–9% Cr ODS, showing strain burst (a and b) corresponding to load drops on the true stress–strain curve (c); and still-frames from TEM in situ compression pillar test on 3 dpa, 500 °C, Fe2+ irradiated Fe–9% Cr ODS, showing dislocation in (d and e) cross-slipping in (f and g).

Figure 4

Figure 5: (a–c) Still-frames from TEM in situ compression pillar test on 1 dpa, 500 °C proton-irradiated Cu–24% Ta, showing two-step grain boundary sliding of the yellow (b) and pink (c) boundaries at a triple junction, corresponding to load drops on the engineering stress–strain curve (d).

Figure 5

TABLE I: Quantitative summary of microstructure of materials tested.

Figure 6

Figure 6: Representative bright-field TEM micrographs of (a) as-received and (b) irradiated Fe–9% Cr ODS, with red arrows indicating oxide nanoclusters and dashed red circles indicating dislocation loops; and (c) as-received and (d) irradiated Cu–24% Ta, with yellow arrows indicating Ta nanoclusters $\lessapprox$ 20 nm and solid yellow circles indicating Ta phases $\gtrapprox$ 20 nm. Composition of Ta phases and nanoclusters in irradiated Cu–24% Ta is confirmed by (e) zero loss image and (f) EFTEM.

Figure 7

Figure 7: Flowchart of Matlab™ algorithm developed to automate pillar width determination and true stress–strain curve calculation.

Figure 8

Figure 8: Application of edge tracking algorithm to a frame that has been converted to binary (black and white) image, with the starting points for the edge tracking algorithm marked ‘+’, pillar edges marked ‘×’, and pillar base and head marked ‘○’.

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