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Damage characteristics of fused silica under low-temporal coherence light

Published online by Cambridge University Press:  27 February 2024

Chong Shan
Affiliation:
Shanghai Engineering Research Center of Ultra-precision Optical Manufacturing, School of Information Science and Technology, Fudan University, Shanghai, China Shanghai Institute of Laser Plasma, China Academy of Engineering Physics, Shanghai, China Key Laboratory of High Power Laser Materials, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, China
Lingbao Kong*
Affiliation:
Shanghai Engineering Research Center of Ultra-precision Optical Manufacturing, School of Information Science and Technology, Fudan University, Shanghai, China
Fujian Li
Affiliation:
Shanghai Institute of Laser Plasma, China Academy of Engineering Physics, Shanghai, China
Yong Cui
Affiliation:
Shanghai Institute of Laser Plasma, China Academy of Engineering Physics, Shanghai, China
Lailin Ji
Affiliation:
Shanghai Institute of Laser Plasma, China Academy of Engineering Physics, Shanghai, China
Quan Zheng
Affiliation:
Shanghai Institute of Laser Plasma, China Academy of Engineering Physics, Shanghai, China
Daxing Rao
Affiliation:
Shanghai Institute of Laser Plasma, China Academy of Engineering Physics, Shanghai, China
Ruijing He
Affiliation:
Shanghai Institute of Laser Plasma, China Academy of Engineering Physics, Shanghai, China
Xiaohui Zhao
Affiliation:
Shanghai Institute of Laser Plasma, China Academy of Engineering Physics, Shanghai, China
Yuanan Zhao
Affiliation:
Key Laboratory of High Power Laser Materials, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, China
Zhan Sui
Affiliation:
Shanghai Institute of Laser Plasma, China Academy of Engineering Physics, Shanghai, China
*
Correspondence to: Lingbao Kong, Shanghai Engineering Research Center of Ultra-precision Optical Manufacturing, School of Information Science and Technology, Fudan University, Shanghai 200438, China. Email: LKong@fudan.edu.cn

Abstract

The damage characteristics of fused silica were investigated under low-temporal coherence light (LTCL). It was found that the laser-induced damage threshold (LIDT) of fused silica for the LTCL was lower than that of the single longitudinal mode pulse laser, and for the LTCLs, the LIDTs decrease with the increasing of laser bandwidth, which is not consistent with the temporal spike intensity. This is due to the nonlinear self-focusing effect and multi-pulse accumulation effect. The specific reasons were analyzed based on theoretical simulation and experimental study. This research work is helpful and of great significance for the construction of high-power LTCL devices.

Information

Type
Research Article
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (https://creativecommons.org/licenses/by/4.0), which permits unrestricted re-use, distribution and reproduction, provided the original article is properly cited.
Copyright
© The Author(s), 2024. Published by Cambridge University Press in association with Chinese Laser Press
Figure 0

Figure 1. The experimentally measured (a) spectra and (b) temporal waveforms of each incident laser; (c) simulation of spike structures of different bandwidths; (d) the LIDT test results. The damage probabilities were obtained by 10 shots for one fluence step. The error bars were derived from the deviation in the damage probability at each incident fluence after five LIDT tests.

Figure 1

Table 1. The LIDT of each incident laser focus at different positions from the input surface.

Figure 2

Figure 2. Simulation results of the self-focusing effect for each bandwidth.

Figure 3

Figure 3. The results of z-scans of the SLM laser and the LTCLs with each bandwidth. The curves are the simulation results, and the dots correspond to the experimental results.

Figure 4

Figure 4. The results of transmission signal variation by the time-resolved test method: (a) schematic diagram of the filamentary damage; (b) the test result of the SLM laser and the LTCLs with each bandwidth.

Figure 5

Figure 5. The damage morphologies of the fused silica for each incident laser: (a) integral filamentation damage captured by the CCD camera; (b) head damage morphologies of filamentation damage captured by the microscope.