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Experimental overview of linearity metrics using complex modulated signals
Published online by Cambridge University Press: 07 October 2025
Abstract
This paper presents an experimental overview of linearity metrics using setups based on a PNA-X and a vector signal analyzer to evaluate key performance indicators of a transistor, such as noise power ratio and error vector magnitude, under unequally spaced multi-tone (USMT) and various quadrature amplitude modulation signals. The purpose of this study is to verify the feasibility of characterizing the linearity of transistors and RF power amplifiers on a PNA-X-based measurement bench by exploiting the statistical properties of the previously developed USMT signal, which allows NPR measurement in a single pass. The measurements were performed on an 
$8 \times 50\,\mu\,\mathrm{m}$ gate GaN transistor from UMS Foundry,operating on-wafer at 29 GHz.
Information
- Type
- Research Paper
- Information
- International Journal of Microwave and Wireless Technologies , Volume 17 , Issue 7 , September 2025 , pp. 1097 - 1106
- Copyright
- © The Author(s), 2025. Published by Cambridge University Press in association with The European Microwave Association.
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