Book contents
- Frontmatter
- Contents
- Preface to the second English edition
- Preface to the first edition
- Introduction
- 1 Abbe's sine condition
- 2 Fourier optics
- 3 Effect of polarization on diffraction in systems of high numerical aperture
- 4 Gaussian beam optics
- 5 Coherent and incoherent imaging
- 6 First-order temporal coherence in classical optics
- 7 The van Cittert–Zernike theorem
- 8 Partial polarization, Stokes parameters, and the Poincaré sphere
- 9 Second-order coherence and the Hanbury Brown–Twiss experiment
- 10 What in the world are surface plasmons?
- 11 Surface plasmon polaritons on metallic surfaces
- 12 The Faraday effect
- 13 The magneto-optical Kerr effect
- 14 The Sagnac interferometer
- 15 Fabry–Pérot etalons in polarized light
- 16 The Ewald–Oseen extinction theorem
- 17 Reciprocity in classical linear optics
- 18 Optical pulse compression
- 19 The uncertainty principle in classical optics
- 20 Omni-directional dielectric mirrors
- 21 Linear optical vortices
- 22 Geometric-optical rays, Poynting's vector, and the field momenta
- 23 Doppler shift, stellar aberration, and convection of light by moving media
- 24 Diffraction gratings
- 25 Diffractive optical elements
- 26 The Talbot effect
- 27 Some quirks of total internal reflection
- 28 Evanescent coupling
- 29 Internal and external conical refraction
- 30 Transmission of light through small elliptical apertures
- 31 The method of Fox and Li
- 32 The beam propagation method
- 33 Launching light into a fiber
- 34 The optics of semiconductor diode lasers
- 35 Michelson's stellar interferometer
- 36 Bracewell's interferometric telescope
- 37 Scanning optical microscopy
- 38 Zernike's method of phase contrast
- 39 Polarization microscopy
- 40 Nomarski's differential interference contrast microscope
- 41 The van Leeuwenhoek microscope
- 42 Projection photolithography
- 43 Interaction of light with subwavelength structures
- 44 The Ronchi test
- 45 The Shack–Hartmann wavefront sensor
- 46 Ellipsometry
- 47 Holography and holographic interferometry
- 48 Self-focusing in nonlinear optical media
- 49 Spatial optical solitons
- 50 Laser heating of multilayer stacks
- Index
- References
39 - Polarization microscopy
Published online by Cambridge University Press: 31 January 2011
- Frontmatter
- Contents
- Preface to the second English edition
- Preface to the first edition
- Introduction
- 1 Abbe's sine condition
- 2 Fourier optics
- 3 Effect of polarization on diffraction in systems of high numerical aperture
- 4 Gaussian beam optics
- 5 Coherent and incoherent imaging
- 6 First-order temporal coherence in classical optics
- 7 The van Cittert–Zernike theorem
- 8 Partial polarization, Stokes parameters, and the Poincaré sphere
- 9 Second-order coherence and the Hanbury Brown–Twiss experiment
- 10 What in the world are surface plasmons?
- 11 Surface plasmon polaritons on metallic surfaces
- 12 The Faraday effect
- 13 The magneto-optical Kerr effect
- 14 The Sagnac interferometer
- 15 Fabry–Pérot etalons in polarized light
- 16 The Ewald–Oseen extinction theorem
- 17 Reciprocity in classical linear optics
- 18 Optical pulse compression
- 19 The uncertainty principle in classical optics
- 20 Omni-directional dielectric mirrors
- 21 Linear optical vortices
- 22 Geometric-optical rays, Poynting's vector, and the field momenta
- 23 Doppler shift, stellar aberration, and convection of light by moving media
- 24 Diffraction gratings
- 25 Diffractive optical elements
- 26 The Talbot effect
- 27 Some quirks of total internal reflection
- 28 Evanescent coupling
- 29 Internal and external conical refraction
- 30 Transmission of light through small elliptical apertures
- 31 The method of Fox and Li
- 32 The beam propagation method
- 33 Launching light into a fiber
- 34 The optics of semiconductor diode lasers
- 35 Michelson's stellar interferometer
- 36 Bracewell's interferometric telescope
- 37 Scanning optical microscopy
- 38 Zernike's method of phase contrast
- 39 Polarization microscopy
- 40 Nomarski's differential interference contrast microscope
- 41 The van Leeuwenhoek microscope
- 42 Projection photolithography
- 43 Interaction of light with subwavelength structures
- 44 The Ronchi test
- 45 The Shack–Hartmann wavefront sensor
- 46 Ellipsometry
- 47 Holography and holographic interferometry
- 48 Self-focusing in nonlinear optical media
- 49 Spatial optical solitons
- 50 Laser heating of multilayer stacks
- Index
- References
Summary
The state of polarization of a given beam of light is modified upon reflection from (or transmission through) an object. The resulting change in polarization state conveys information about the structure and certain physical properties of the illuminated region. Polarization microscopy is a variant of conventional optical microscopy that enables one to monitor these changes over a small area of a specimen. Such observations then allow the user to identify and analyze the specimen's structural and other physical features.
Traditionally, observations with a polarization microscope have been categorized “orthoscopic” or “conoscopic.” orthoscopic observations involve direct imaging of the sample itself, thus allowing one to view the indentations, striations, variations of optical activity and birefringence, etc., over the sample's surface. conoscopic observations, however, involve illuminating a crystalline surface with a cone of light and then imaging the exit pupil of the objective lens. This mode of observation is used in characterizing the crystal's ellipsoid of birefringence and identifying its optical axes.
The polarization microscope
Figure 39.1 is a simplified diagram of a polarization microscope. The light source is typically an extended white light source, such as a halogen lamp or an arc lamp. The collected and collimated beam from the source is linearly polarized as a result of passage through a polarizer. In metallurgical microscopes, such as the one shown here, the objective lens is used both for illuminating the sample and for collecting the reflected light.
- Type
- Chapter
- Information
- Classical Optics and its Applications , pp. 554 - 565Publisher: Cambridge University PressPrint publication year: 2009