Skip to main content Accessibility help
×
Hostname: page-component-848d4c4894-pftt2 Total loading time: 0 Render date: 2024-05-16T22:26:49.897Z Has data issue: false hasContentIssue false

1 - Methods of investigation

Published online by Cambridge University Press:  05 June 2012

Gerald H. Meier
Affiliation:
University of Pittsburgh
Frederick S. Pettit
Affiliation:
University of Pittsburgh
Get access

Summary

The investigation of high-temperature oxidation takes many forms. Usually one is interested in the oxidation kinetics. Additionally, one is also interested in the nature of the oxidation process, i.e., the oxidation mechanism. Figure 1.1 is a simple schematic of the cross-section of an oxide formed on the surface of a metal or alloy. Mechanistic studies generally require careful examination of the reaction products formed with regard to their composition and morphology and often require examination of the metal or alloy substrate as well. Subsequent sections of this chapter will deal with the common techniques for measuring oxidation kinetics and examining reaction-product morphologies.

In measuring the kinetics of degradation and characterizing the corresponding microstructures questions arise as to the conditions to be used. Test conditions should be the same as the application under consideration. Unfortunately, the application conditions are often not precisely known and, even when known, can be extremely difficult to establish as a controlled test. Moreover, true simulation testing is usually impractical because the desired performance period is generally much longer than the length of time for which laboratory testing is feasible. The answer to this is accelerated, simulation testing.

Accelerated, simulation testing requires knowledge of microstructure and morphological changes. All materials used in engineering applications exhibit a microstructural evolution, beginning during fabrication and ending upon termination of their useful lives.

Type
Chapter
Information
Publisher: Cambridge University Press
Print publication year: 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Mrowec, S. and Stoklosa, A. J., J. Therm. Anal., 2 (1970), 73CrossRef
Goldstein, J. I., Newbury, D. E., Echlin, P.et al., Scanning Electron Microscopy and X-Ray Microanalysis, New York, NY, Plenum Press, 1984Google Scholar
Loretto, M. H., Electron Beam Analysis of Materials, 2nd edn., London, UK, Chapman and Hall, 1994Google Scholar
Cullity, B. D., Elements of X-Ray Diffraction, 2nd edn, Reading, MA, Addison Wesley, 1978Google Scholar
Noyan, I. C. and Cohen, J. B., Residual Stresses, New York, NY, Springer-Verlag, 1987CrossRefGoogle Scholar
Williams, D. B. and Carter, C. B., Transmission Electron Microscopy, New York, NY, Plenum Press, 1996CrossRefGoogle Scholar
Rühle, M., Salzberger, U. and Schumann, E.. High resolution transmission microscopy of metal/metal oxide interfaces. In Microscopy of Oxidation 2, eds. Newcomb, S. B. and Bennett, M. J., London, UK, The Institute of Materials, 1993, p. 3Google Scholar
Woodruff, D. P. and Delchar, T. A., Modern Techniques of Surface Science, Cambridge, UK, Cambridge University Press, 1989Google Scholar
Grabke, H. J., Leroy, V. and Viefhaus, H., ISIJ Int., 35 (1995), 95CrossRef
Microscopy of Oxidation 1, eds. Bennett, M. J. and Lorimer, G. W., London, UK, The Institute of Metals, 1991Google Scholar
Microscopy of Oxidation 2, eds. Newcomb, S. B. and Bennett, M. J., London, UK, The Institute of Materials, 1993Google Scholar
Microscopy of Oxidation 3, eds. Newcomb, S. B. and Little, J. A., London, UK, The Institute of Materials, 1997Google Scholar
Microscopy of Oxidation 4, eds. Tatlock, G. and Newcomb, S. B., Science Rev., 17 (2000), 1Google Scholar
Microscopy of Oxidation 5, eds. Tatlock, G. and Newcomb, S. B., Science Rev., 20 (2003)Google Scholar

Save book to Kindle

To save this book to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Available formats
×

Save book to Dropbox

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Dropbox.

Available formats
×

Save book to Google Drive

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Google Drive.

Available formats
×