2 results
Dependence of the Au/Ni/Si/Ni Contact Properties on the Si-layer Thickness and the Annealing Temperature in p-type GaN Epilayers
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- Journal:
- Journal of Materials Research / Volume 17 / Issue 5 / May 2002
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1019-1023
- Print publication:
- May 2002
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X-Ray Truncation Rod Analysis Of Cu Thin Films on C-Plane Sapphire
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- Journal:
- MRS Online Proceedings Library Archive / Volume 437 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 21
- Print publication:
- 1996
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- Article
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