14 results
Volumetric MRI Measurements in Vascular Dementia and Alzheimer's Disease
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- Journal:
- European Psychiatry / Volume 11 / Issue S4 / 1996
- Published online by Cambridge University Press:
- 16 April 2020, pp. 372s-s372
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Hearing loss and fluctuating hearing levels in X-linked hypophosphataemic osteomalacia
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- The Journal of Laryngology & Otology / Volume 123 / Issue 1 / January 2009
- Published online by Cambridge University Press:
- 18 February 2008, pp. 136-140
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- January 2009
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Transmission Electron Microscopy Study of FeHfN Thin Films for Magnetic Properties Optimization and Integration Above Silicon Circuits.
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1804-1805
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- August 2005
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Determination of the Spatial Resolution Function in Energy Filtered TEM and Application to Thin Gate Oxide Measurements at 80 eV Energy Loss
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 578-579
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- August 2004
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Strain Measurements at a NiSi/Si Interface Using STEM-CBED: A Quantifaction Method for Stress Relaxation During TEM Lamella Preparation
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 24 July 2003, pp. 866-867
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- August 2003
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Inelastic Electron Scattering Observation Using Energy Filtered Transmission Electron Microscopy for Silicon-Germanium Nanostructures Imaging.
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1174-1175
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- August 2002
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Quantitative Thickness Measurements of Thin Oxides Using Low Energy Loss Filtered TEM Imaging
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 560-561
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- August 2001
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Combined Focused Ion Beam, Energy Filtered TEM and STEM Techniques for Semiconductor Device Defects Observation
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 944-945
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- August 2001
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Quantitative Analysis of Si1-xGex using Convergent Beam Electron Diffraction for Extinction Distance Measurements.
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1084-1085
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- August 2000
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Defect Analysis and Process Development of Microelectronics Devices Using Focused Ion Beam and Energy Filtering Transmission Electron Microscopy.
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 900-901
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- August 1999
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Thickness Measurement of Focused Ion Beam Thinned Silicon Crystals Using Convergent Beam.Electron Diffraction and Electron Energy Loss Spectroscopy.
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 898-899
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- August 1999
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Quantitative magnetic resonance imaging and neuropsychological functions in dementia of the Alzheimer type
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- Psychological Medicine / Volume 27 / Issue 1 / January 1997
- Published online by Cambridge University Press:
- 01 January 1997, pp. 221-229
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Effect of Interfacial Oxide Thickness on Titanium Silicide Formation
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- MRS Online Proceedings Library Archive / Volume 260 / 1992
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- 25 February 2011, 329
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- 1992
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Improvement of Wetting of Silicon on Insulator During Lamp Zone Melting Using Plasma Nitridation
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- MRS Online Proceedings Library Archive / Volume 53 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 59
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- 1985
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