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1 results

  • Reversible bending of Si3N4 nanowire

  • Yingjiu Zhang, Nanlin Wang, Rongrui He, Qi Zhang, Jing Zhu, Yunjie Yan
  • Journal:
    Journal of Materials Research / Volume 15 / Issue 5 / May 2000
    Published online by Cambridge University Press:
    31 January 2011, pp. 1048-1051
    Print publication:
    May 2000

  • A reversible bending phenomenon of Si3N4 nanowires on the conductive carbon–formalin microgrid under an illumination of electron beam was observed using a transmission electron microscope. The nanowires exhibit high flexibility. The bending deflection is approximately proportional to the square of the current density (J) of the electron beam. The bending strength of Si3N4 nanowire is much higher than that of bulk Si3N4 materials. The force that bent the nanowires may be an electrostatic force.