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Defect structure of laser deposited Y-Ba-Cu-O thin films on single crystal MgO substrate

Published online by Cambridge University Press:  31 January 2011

R. Ramesh ,
D. M. Hwang ,
J. B. Barner ,
L. Nazar ,
T. S. Ravi ,
A. Inam ,
B. Dutta ,
X. D. Wu  and
T. Venkatesan
R. Ramesh
Affiliation:
Bellcore, Red Bank, New Jersey 07701
D. M. Hwang
Affiliation:
Bellcore, Red Bank, New Jersey 07701
J. B. Barner
Affiliation:
Bellcore, Red Bank, New Jersey 07701
L. Nazar
Affiliation:
Bellcore, Red Bank, New Jersey 07701
T. S. Ravi
Affiliation:
Bellcore, Red Bank, New Jersey 07701
A. Inam
Affiliation:
Bellcore, Red Bank, New Jersey 07701
B. Dutta
Affiliation:
Bellcore, Red Bank, New Jersey 07701
X. D. Wu
Affiliation:
Bellcore, Red Bank, New Jersey 07701
T. Venkatesan
Affiliation:
Bellcore, Red Bank, New Jersey 07701
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Abstract

Structural defects in thin films of nominal composition YBa2Cu3O7 (123) grown on single crystal MgO have been characterized. The main types of stacking defects correspond to the cationic stoichiometries of “248”, “247”, and “224”. Several types of edge dislocations have been observed. Due to the frequent changes in the stacking sequence, antiphase boundaries are created to accommodate the misfit across regions in which the repeat sequence is not identical. The films exhibit a mosaic microstructure due to the formation of grain boundaries in the a-b plane.

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Articles
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Journal of Materials Research , Volume 5 , Issue 4 , April 1990 , pp. 704 - 716
Copyright
Copyright © Materials Research Society 1990

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References

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