A comparative analysis of different Cd1−xZnxTe (CZT) crystals grown by a vertical high pressure Bridgman (VHPB) method is reported. The results of several analytical techniques, such as triple axis x-ray diffraction (TAD), rocking curves, low temperature photoluminescence (PL), scanning electron microscopy (SEM), and proton induced x-ray emission (PIXE) are discussed. Segregated carbon inclusions were identified by SEM and energy dispersive x-ray fluorescence (EDXRF), and the results are interpreted in terms of constitutional supercooling of the solidifying CZT melt. The carbon inclusions significantly decrease the resistivity, and in some cases, the noise is too large for the fabrication of radiation detectors. Combining these results with other measurements reported by our research team , we identify correlations between the growth and the defects identified in these CZT crystals.