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8 - X-ray analysis (2)

Published online by Cambridge University Press:  03 December 2009

S. J. B. Reed
Affiliation:
University of Cambridge
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Summary

Light-element analysis

For present purposes ‘light’ elements are defined as those below 10 in atomic number. Of these, H and He do not produce characteristic X-rays, and the Li K line is outside the accessible wavelength range: the elements (and atomic numbers) concerned are thus Be (4), B (5), C (6), N (7), O (8) and F (9). The K lines of these elements are listed in Table 8.1. Light-element analysis requires an approach that differs in certain respects from that described in the previous chapter for ‘ordinary’ (Z > 10) elements.

The F Kα peak lies easily within the range of the TAP crystal, but O Kα is close to (for some instruments beyond) the upper limit of θ. Lead stearate (2d = 100 Å) covers atomic numbers 5 (B) to 8 (O), but has been superseded by evaporated multilayers (Section 5.3.1), which give more intensity but poorer resolution. To detect long-wavelength X-rays a proportional counter with a thin window must be used (Section 5.3.4). There are potential interferences from high-order lines and the L and M lines of heavier elements, but these are small. Light-element K lines can be detected by thin-window ED detectors (Section 5.2.1) and are reasonably well resolved from each other.

Contamination with carbon (Section 3.10.1) gives rise to a spurious C peak, as well as causing additional absorption of emerging low-energy X-rays (especially O Kα, which is just above the absorption edge of carbon). Anti-contamination measures should therefore be used routinely for light-element analysis.

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Publisher: Cambridge University Press
Print publication year: 2005

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  • X-ray analysis (2)
  • S. J. B. Reed, University of Cambridge
  • Book: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
  • Online publication: 03 December 2009
  • Chapter DOI: https://doi.org/10.1017/CBO9780511610561.009
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  • X-ray analysis (2)
  • S. J. B. Reed, University of Cambridge
  • Book: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
  • Online publication: 03 December 2009
  • Chapter DOI: https://doi.org/10.1017/CBO9780511610561.009
Available formats
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Save book to Google Drive

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Google Drive.

  • X-ray analysis (2)
  • S. J. B. Reed, University of Cambridge
  • Book: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
  • Online publication: 03 December 2009
  • Chapter DOI: https://doi.org/10.1017/CBO9780511610561.009
Available formats
×