CdTexSe1-xsolid solutions with (x) ranging between zero and one were prepared by solid state diffusion under vacuum and their precise lattice constants and X-ray powder diffraction data were determined. It was found that alloys with 0≤x≤0.4 possess the hexagonal wurtzite structure while those with 0.5≤x≤1.0 have the cubic zincblende structure. The lattice parameters obeyed Vegard's law according to the following formulae

Extrapolated lattice constants were a = 6.066(6) Å for the cubic form of CdSe and a = 4.563(6) Å and c = 7.502 (10) Å for the hexagonal form of CdTe.

Thirteen isotypic tellurates having the stoichiometries MIBaNbTe2O9 and BaNbTe2O9, with MI = Li,Na,K,Rb,Ag and MII = Mg,Ca,Sr,Ba,Cu,Zn,Cd,Pb, have been synthesized by solid state reaction. Single crystals of KBaNbTe2O9 were obtained. The compounds crystallize in the orthorhombic space group P212121 [19]. Unit-cell parameters for the 13 compounds and powder diffraction patterns for three representative compounds, KBaNbTe2O9, Ba1.5NbTe2O9 and Cd0.5BaNbTe2O9, are given.

Fifteen reference patterns of oxide ceramics are reported. Included in the fifteen reference patterns are data for nine high critical temperature superconducting oxide and related phases Ba2Cu3ErO7, Ba3.2Cu1.7Er0.8O6.1·xCO2, Ba2Cu3HoO7, Ba2Cu3(Pr0.5Y0.5)O7, Ba3Dy4O9, Ba3Yb4O9, (Ba0.6Sr0.4)2Cu3YO7, (Ba0.8Sr0.2)2Cu3YO7, and CuNd2O4. The general methods of producing diese X-ray powder diffraction reference patterns were described previously in this journal (Vol. 1, No. 1, pg. 40 (1986)). The symbols used in diis article are defined in the PDF cards.

The linear coefficient of thermal expansion for three silicon single-crystal samples, taken from the head, middle, and tail of the same boule, and their powder samples have been measured at room temperature by using an X-ray powder diffractometer. All samples yield the same expansion value α=2.45 (± 0.04) × 10−6 °C at 25 °C. The results of this experiment show that the linear coefficient of thermal expansion of silicon at room temperature is not dependent on its single-crystal state or its powder state.

X-ray powder diffraction data are reported for α-brass with the composition Cu: 63.44±0.04 wt %, Zn: 36.45±0.06 wt %. No valid reference card for this material is present in the JCPDS-ICDD database. The investigated brass composition is cubic (Fm3m) with a0: 3.69612±0.00014 Å, unit cell volume: 50.4938±0.0058 Å3, density calculated: 8.44±0.05 g/cm3, density measured: 8.43±0.03 g/cm3. The X-ray diffraction pattern presented resembles that of deleted reference card 6-657 in great detail.

Sm2Bi2Ti3O12 was synthesized by solid state reaction from Sm2O3, Bi2O3, and TiO2 in molar relation 1:1:3. Title compound is isostructural with Bi4Ti3O12. Products of the reaction were analyzed by X-ray diffraction methods. The crystal structure was refinement by the Rietveld Method. Cell parameters are: a=5.368(2), b=5.369(2), and c=32.71(2) Å, space group Fmmm. The final R value was 9.96% (Rw=13.43%).© 1998 International Center for Diffraction Data.