New powder X-ray diffraction data of davyne, a member of the cancrinite group of minerals, were collected using a rotating anode diffractometer: the hexagonal cell parameters are a=12.6711(3) Å, c=5.3278(2) Å, volume 740.82(4) Å3 (space group P63). The strongest lines are: 3.658(100), 4.790(73), 3.272(70), 2.112(48), 2.438(22), 2.663(19), 1.781(19), and 4.147(17). The new data provide quantitative intensities improved precision in d-spacings and cover an increased 2θ angular range with respect to PDF 20-379. Measured intensities and a simulated pattern are reported together with crystal-chemical considerations.

Crystalline structures of one single- and two multi-layer magnetic CoCrTa films were characterized by X-ray powder diffraction technique. Structural parameters such as crystalline phase, preferred orientation, crystallite size and microstrain (which control the magnetic properties) have been determined. Polycrystalline diffractions from lattice planes parallel and perpendicular to the surface of a film were obtained with the specimen in reflection and in transmission, respectively. Phase identification of the ternary alloy (Co85Cr15)90Ta10 magnetic layers of the specimens indicated a disordered solid solution of Cr and Ta in Co, and the alloy has a hexagonal close-packed (h.c.p.) (A3) structure. Line broadening analysis showed crystallite size anisotropy and columnar CoCrTa grains. The crystal growth was disrupted by the nonmagnetic “amorphous” spacing layers in the multi-layer specimens. The disruption increased with the decreasing magnetic layer thickness. Compared to those of the single-layer film, a lesser (00l) basal plane preferred orientation with a larger perpendicular c-axis dispersion, smaller crystallite sizes and higher microstrains at L≥50Å were obtained in the multi-layer specimen consisting of eight 500Å thick magnetic layers. The magnetic particles were found to be poorly crystallized in the multi-layer specimen where the thicknesses of the 33 magnetic layers were limited to 150Å each.

Near-surface triaxial strain/stress states in polycrystalline solids are required for a full tensorial treatment including all elements of the strain/stress tensor. A possible depth dependency of the strain/stress is at best observed by grazing incidence diffraction in Seemann–Bohlin geometry (SBG). The computer program SBGBBG calculates the full strain/stress tensor from X-ray diffraction data measured either in SBG or in Bragg–Brentano geometry (BBG). At present SBGBBG is applicable only on texture-free materials.

Icosahedral boron phosphide (B12P2) was directly synthesized from elemental powders by a high-temperature reaction under an argon pressure. Powder diffraction data were collected for two B12P2 samples, and diffraction patterns were compared with calculated patterns of phosphorus deficient crystals: B12+xP2−x for 0<;x<0.2. The as-synthesized B12P2 appears to be close to its ideal stoichiometry based on the consistency between the observed and the calculated values of the relative intensity for all diffraction planes below 90° 2θ.

Standard Reference Materials (SRMs) for determining instrumental line profiles should not exhibit measurable broadening from structural imperfections, but owing the effects of sample transparency and other geometrical effects, the quality of possible SRMs cannot necessarily be assessed satisfactorily with data from a conventional divergent-beam diffractometer. The problem of transparency can be avoided if parallel beam optics is used, as for instance on a synchrotron radiation powder diffraction station employing Parrish (Soller-type receiving slit assembly) geometry. Data from such a configuration are used to compare three SRMs commonly used in line-profile analysis.

X-ray powder data and refined cell parameters for two titanium carbonitride solid solutions are presented. Some deviations from Vegard's law were observed.

A new method is used in measuring the linear thermal expansion coefficients in composite consisting of a substrate Gd3Ga2Ga3O12 (GGG) and its epitaxial layer Y3Fe2Fe3O12 (YIG) within the temperature range 13.88 °C–32.50 °C. The results show that the thermal expansion coefficient of GGG in composite is larger than that of the GGG in single crystal; the thermal expansion coefficient of thick film YIG is also larger than that of thin film. The results also show that the thermal expansion coefficient of a composite consisting of film and its substrate can be measured by using a new method.

The determination of thin film thickness by four X-ray reflectivity methods (namely, the peak separation, the Fourier transform, the modified Bragg equation, and the curve-fitting methods) has been studied. An analysis of SrS and BaF2 thin films showed thickness values determined by the methods agreed to within 4%. The curve-fitting method had the highest accuracy but was time-consuming. The peak separation, the Fourier transform, and the modified Bragg equation methods are considerably faster and, on average, gave 2.8%, 0.9%, and 0.2% larger thicknesses than those of the curve-fitting method.

A computer program for analysing two-component interstratified structures by two different Fourier transform methods is described. The first method consists of the calculation of the X-ray diffraction intensity function, and in the second one (direct method) the distribution function of interlayer distances is calculated. The programs have been written in compiled GWBASIC for an Olivetti M-24 microcomputer (MS-DOS operating system), and they may also be run on any IBM compatible personal computer. As an example, this program is applied for the analysis of a chlorite-smectite interstratified mineral.

X-ray powder diffraction analysis of samples obtained by thermal treatment of coprecipitated amorphous xCd(II) (1-x)Ni(II)2Fe(III)-hydroxides reveals that intermediate crystalline spinel species with lattice constants less than those for the nominal composition are formed before the designated cadmium-nickel ferrites, CdxNil-xFe2O4, come into existence.

Bright apple green millimeter-sized crystals of tavorite from the Tip Top pegmatite, near Custer, South Dakota are triclinic, space group , with refined unit-cell parameters a = 5.340(2), b = 7.283(2), c = 5.110(2)Å, α = 109.29(2)°, β = 97.86(3)°, γ = 106.32(3)°, V = 174.1(3)Å3, a:b:c = 0.7332:1:0.7016, Z = 2, D(m) (suspension in methylene iodide) = 3.32(1) and D(x) = 3.33 g/cm3 (for the theoretical formula). A fully indexed X-ray powder pattern is presented. Semiquantitative electron microprobe and secondary ion mass spectroscopic analyses indicate a formula near end-member LiFe + 3(PO4)(OH). The Tip Top tavorite is biaxial positive, α = 1.795(5), β = 1.81(1), γ = 1.86(1), 2V(meas.) = 50(2)°, 2V(calc.) = 59°, XΛa ≃ 15°, YΛb ≃ 0°, and ZΛc ≃ 38°. There is no evidence for optical absorption, pleochroism or dispersion.

A new X-ray diffraction pattern for the compound cerium oxygen apatite, Ce4.67[SiO4]3O is suggested. The compound was prepared by the solid state reaction of the oxides, CeO2 and SiO2 and has a hexagonal crystal structure with the lattice constants a = 9.6578 Å and c = 7.1187 Å. The sample of the most recent PDF pattern 31-0336* (Visser, 1978) for this compound is believed to be contaminated with significant quantities of N owing to the fact that it was prepared by mixing Ce2O3 and Si3N4 and its very close resemblance to the pattern displayed in the PDF 33-0333 given for the cerium “nitrogen” apatite, Ce5[SiO4]3N.

Diffracted intensities from an X-ray diffractometer operating with fixed or variable divergence slits were compared, following a reported systematic deviation from the theoretical 1/sinθ intensity ratio between these two slit configurations. The theoretical relationship was found to hold over a wide 2θ range provided the anti-scatter slit did not obstruct the beam at higher diffraction angles as the variable slit increased beam divergence. Such obstruction was found to be a possible explanation for the reported deviation.

Cristobalite and tridymite are distinct forms of crystalline silica which, along with quartz, are encountered in industrial operations and industrial products. Because the International Agency for Research on Cancer has designated “crystalline silica” as an IARC Group 2A (probable carcinogen) and quartz and cristobalite as a Group 1 (carcinogen), it is important to properly identify and quantify the silica phase in all materials used in production and encountered in products. Opal is a form of hydrated silica which is also encountered in industry. Although some forms of opal mimic cristobalite and tridymite, they are not truly crystalline. The term “silica” in the industrial sense is used to mean any material whose composition is SiO2 whether it is crystalline or noncrystalline. Some people also consider silica to include hydrated SiO2. There are many forms of SiO2 which have both long-range and short-range order and are recognized as crystalline phases among which are quartz, cristobalite, and tridymite. The hydrated silicas, on the other hand, pose an enigma. Only a few forms show sufficient long-range and short-range order to be considered crystalline. The mineral silhydrite is an example. Opal in all its forms lacks sufficient order to be considered crystalline. Even opal-C, which produces a X-ray pattern similar to the diffraction pattern of cristobalite, lacks not only sufficient order to be considered crystalline but also contains water in the structural make-up. This paper discusses a classification and nomenclature for these forms which is critical to proper regulation. It also reviews the recent literature on tridymite, cristobalite, and opal, and provides an extensive bibliography. Modern studies have shown that opal-A is disordered, but opal-CT and opal-C contain ordered domains that mimic stacked sequences of cristobalite and tridymite sheets such that X-ray patterns show features similar to the crystalline cristobalite and tridymite. There is debate on whether the ordered regions have lost the water that characterizes the opals. In fact, heating studies have shown that all opals show changes on heating characteristic of materials that lose water in the process. The TEM evidence showing domains in the range 10–30 nm in a matrix of disordered opal suggest that the proper term for this system is paracrystalline analogous to inorganic and organic polymers.