HighScore with the Plus option (HighScore Plus) is the commercial powder diffraction analysis software from PANalytical. It has been in constant development over the last 13 years and has evolved into a very complete and mature product. In this paper, we present a brief overview of the suite focusing on the latest additions and its user-friendliness. The introduction briefly touches some basic ideas behind HighScore and the Plus option.

A Fortran 77 computer program has been developed for the quantitative analysis of minerals by multiphase profile analysis of the complete powder diffraction pattern. Featured are full-matrix least-squares refinement of 14 Rietveld “instrumental parameters” (phase scales, asymmetry, preferred orientations (March model), linewidths, instrument zero, lineshapes and unit cell dimensions), Brindley particle absorption contrast factors and amorphicity corrections. The program uses a crystal structure Databank, which contains information on absorption coefficients, unit cell data and crystal structures for some 90 common minerals. New minerals can be easily added. Structure parameters are also refinable by a profile decomposition method using a program called STRUCT. The sum of the calculated patterns, derived from the crystal structure data, is fitted to the observed pattern by a program called TRACSCAL which runs in singlepass multiphase mode and, after the above corrections have been applied, the weight percentages of the component phases are calculated from the Rietveld scaling factors.

The program runs on an IBM-compatible AT computer with 640K of RAM, on an extended memory AT, or a mainframe system. Examples of its use are given with standard mixtures and naturally occurring specimens. On an AT computer with 20MHz clock speed a scaling run, including data input, reading of the pattern, processing of (hkl) files, calculation of the profile and one cycle of least squares fitting takes about 30 seconds for binary standard mixtures and about 2.5 minutes for a 7-phase natural bauxite pattern containing 320 independent (hkl) reflections.

The Reference Intensity Ratio (RIR) is a general, instrument-independent constant for use in quantitative phase analysis by the X-ray powder diffraction internal standard method. When the reference standard is corundum, RIR is known as I/Ic; These constants are collected in the Powder Diffraction File (1987), can be calculated, and can be measured. Recommended methods for accurate measurement of RIR constants are presented, and methods of using these constants for quantitative analysis are discussed. The numerous, complex constants in Copeland and Bragg's method introduced to account for superimposed lines can be simply expressed in terms of RIR constants and relative intensities. This formalism also permits introduction of constraints and supplemental equations based on elemental analysis.

The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards. The patterns are a continuation of the series of standard X-ray diffraction powder patterns published previously in the NBS Circular 539, the NBS Monograph 25, and in this journal. The methods of producing these reference patterns are described in this journal, Vol. 1, No. 1, p. 40 (1986).

The data for each phase apply to the specific sample described. A sample was mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2-theta values for these standards are specified in the methods described (ibid.). Data, from which the reported 2-theta values were determined, were measured with a computer controlled diffractometer. Computer programs were used to locate peak positions and calibrate the patterns as well as to perform variable indexing and least squares cell refinement.

A Monte Carlo code for indexing powder diffraction patterns is presented. Cell parameters are generated randomly and tested against an idealized powder profile generated from the extracted d’s and I’s. Limits with this program in solving problems associated with zeropoint errors and impurity lines are examined. Most problems (V<2000 Å3, cell parameters <20 Å) are solved in less than 1–15 min if the symmetry is as low as monoclinic (with a >2 GHz processor); more time is needed for triclinic cases. Attempts are shown to be successful for the indexation of two-phase samples in simple cases (combining orthorhombic or higher symmetries). © 2004 International Centre for Diffraction Data.

Key words: powder diffraction, indexing, Monte Carlo

Crystallite size determined by X-ray line profile analysis is often smaller than the grain or subgrain size obtained by transmission electron microscopy, especially when the material has been produced by plastic deformation. It is shown that besides differences in orientation between grains or subgrains, dipolar dislocation walls without differences in orientation also break down coherency of X-rays scattering. This means that the coherently scattering domain size provided by X-ray line profile analysis provides subgrain or cell size bounded by dislocation boundaries or dipolar walls.

The definitions for important Rietveld error indices are defined and discussed. It is shown that while smaller error index values indicate a better fit of a model to the data, wrong models with poor quality data may exhibit smaller values error index values than some superb models with very high quality data.

Methods extracting fast all the peak intensities from a complete powder diffraction pattern are reviewed. The genesis of the modern whole powder pattern decomposition methods (the so-called Pawley and Le Bail methods) is detailed and their importance and domains of application are decoded from the most cited papers citing them. It is concluded that these methods represented a decisive step toward the possibility to solve more easily, if not routinely, a structure solely from a powder sample. The review enlightens the contributions from the Louër’s group during the rising years 1987–1993.