The X-ray powder diffraction patterns of two liquid aniline derivatives o-chloroaniline, and m-chloroaniline were measured at 250 °K in a low temperature chamber. Both compounds crystallize in the orthorhombic system with the unit cell parameters refined to a=1.8391(3) nm, b=1.0357(2) nm, c=0.6092(1) nm, space group Pmmm(47) and a=0.450 39(9) nm, b=1.9820(4) nm, c=1.2699(4) nm, space group Pcca(54) for o-chloroaniline and m-chloroaniline, respectively. Investigated at room temperature, 2,6-dichloroaniline crystallizes in the monoclinic system, space group P21/c(14), a=1.1329(2) nm, b=0.41093(8) nm, c=1.5445(3) nm, α=γ=90° β=99.96(2)°.

Hard turning, i.e., turning hardened steels, may produce the unique “hook” shaped residual stress (RS) profile characterized by surface compressive RS and subsurface maximum compressive RS. However, the formation mechanism of the unique RS profile is not yet known. In this study, a novel hybrid finite element modeling approach based on thermal-mechanical coupling and internal state variable plasticity model has been developed to predict the unique RS profile patterns by hard turning AISI 52100 steel (62 HRc). The most important controlling factor for the unique characteristics of residual stress profiles has been identified. The transition of maximum residual stress at the surface to the subsurface has been recovered by controlling the plowed depth. The predicted characteristics of residual stress profiles favorably agree with the measured ones. In addition, friction coefficient only affects the magnitude of surface residual stress but not the basic shape of residual stress profiles.

Synthetic diamonds are an important class of industrial material. During synthesis impurities may get introduced into diamond. Identification and quantification of impurities is important as they affect the properties and suitability of the diamonds for their application. Impurities in an industrial synthetic diamond powder sample were analyzed by X-ray diffraction (XRD) and also by chemical methods. X-ray diffraction pattern showed diamond as the major phase and α-iron as a minor phase. Quantitative analysis of crystalline phases was done by performing Rietveld refinement of the XRD profile. Chemical analysis showed the presence of several other impurities as well, though in small amounts. It was considered that the impurities other than iron were in amorphous form and an estimate of the amorphous content was made on this basis. Relative phase composition of diamond and iron as estimated by XRD were corrected for the amorphous content to obtain absolute phase composition.

After heat treating, finish machining of the hardened steel represents the last manufacturing step of machine elements. The practically most important operation of grinding is applied to achieve edge zone compressive residual stresses, best surface quality, and dimensional accuracy. Metal removal involves high plastic deformation work. Glide and intersection processes raise the density and produce lower energy substructures of dislocations. The temperature and time behavior of postmachining thermal treatment is analyzed on ground and honed martensitic SAE 52100 rolling bearing steel. Microstructure stabilization is reflected in a large XRD peak width decrease in the surface. The kinetics are modeled by rate-controlling carbide dissolution as the carbon source for Cottrell-type segregation at dislocations. This thermal static strain aging is verified by the formation of a slight white etching surface layer. The model is also extended to consider superimposed thermal dislocation recovery. Both effects are separable. In rolling contact fatigue tests under mixed friction conditions, air reheating below the tempering temperature, which avoids hardness loss, leads to a significant lifetime increase. The effect also occurs after cold working.

The X-ray fluorescence holography (XFH) method has drawn the attention of many researchers as a novel experimental technique for imaging a three-dimensional local atomic structure around a certain element in a single crystal. Synchrotron radiation (SR) has been mainly used for the measurements because of extremely weak signals that are about 0.3% of isotropic fluorescent radiation. The measurements limited to the use of a SR source clearly hinder from increasing the number of the users. Thus, we developed a laboratory XFH equipment with a conventional X-ray source by using a singly bent graphite monochromator with a large curvature and X-ray detector for a high counting rate. With this equipment, we have successfully demonstrated that high-quality hologram data of a gold single crystal almost equivalent to those with a SR source are obtained. Four different holograms are recorded in the normal and inverse XFH modes. An atomic image reconstructed from these holograms patterns shows a distinct atomic image of Au

X-ray diffraction, selected area electron diffraction, and high-resolution transmission electron microscope techniques were used to investigate the crystalline structures of one-dimensional tungsten oxide nanowires prepared by the hydrothermal method. The as-synthesized products were found to exhibit increasing crystallinity with increasing reaction time, and tungsten oxide nanowires have crystalline defects, including stacking faults, dislocations, and vacancies. The results on the crystal defects help us to obtain a better understanding of the temperature-dependent morphological evolution of the ultrathin nanowires synthesized under different thermal processes.

CdTe nanorods and various branched nanostructures with different crystal structures were have successfully prepared via the catalyst-assisted vacuum thermal evaporation (CVTE) technique using various experimental parameters. SEM and XRD studies were carried out on the as-prepared CdTe nanostructures. The results show that the morphologies and crystal structures of the products were strongly influenced by the growth conditions and the mole ratios of Bi and CdTe. In the high mole ratio (0.08:1) of Bi and CdTe, CdTe branched nanostructures of CdTe were obtained, while nanorods of CdTe were formed at a lower mole ratio of 0.05:1. The crystal structure of products is either Zinc blende or a two-phase mixture of zinc blende and wurtzite. The content of the wurtzite phase were found to increase with increasing growth temperature. Our results also reveal that high growth temperature tends to form the wurtzite phase, and stacking faults may exist in materials grown in higher temperatures. These nanostructures grow following the vapor–liquid–solid (VLS) mechanism.

Results of Rietveld refinement for indium nitride data collected in the temperature range 105–295 K are presented. Acicular microcrystals of indium nitride prepared by reaction of liquid indium with nitrogen plasma were studied by X-ray diffraction. The diffraction measurements were carried out at the Swiss-Norwegian Beamline SNBL (ESRF) using a MAR345 image-plate detector. Excellent counting statistics allowed for refinement of the lattice parameters of InN as well as those of the metallic indium secondary phase. In the studied temperature range, the InN lattice parameters show a smooth increase that can be approximated by a linear function. Lattice-parameter dependencies confirm the trends indicated earlier by data measured using a conventional equipment. The relative change of both the a and c lattice parameters with increasing the temperature in the studied range is about 0.05%. The axial ratio slightly decreases with rising temperature. The experimental value of the free structural parameter, u=0.3769(14), is reported for InN for the first time. Its temperature variation is found to be considerably smaller than the experimental error. The thermal-expansion coefficients (TECs), derived from the linearly approximated lattice-parameter dependencies, are αa=3.09(14)×10−6 K−1 and αc=2.79(16)×10−6 K−1. The evaluated TECs are generally consistent with the earlier data. For the present dataset, the accuracy is apparently higher for both, the lattice parameters and thermal-expansion coefficients, than for the earlier results. The refined lattice parameter cIn of the indium secondary phase exhibits the known strongly nonlinear behavior; a shift (ΔT equal about −50 K) of the maximum in cIn(T) dependence is observed with respect to the literature data.

The X-ray powder diffraction patterns for three two-component molecular crystals composed of 4-chloroanilinium and chloronitrobenzoic acids with different substituted positions are reported and discussed. © 2004 International Centre for Diffraction Data.

The structure of two biomimetic copper complexes bis[4-benzylaldimino-3-methyl-1-phenyl-5-thio (seleno)pyrazolato]copper(II)—36 32N6X2Cu (where X=S, Se) have been studied and X-ray patterns of these compounds have been prepared using the Rietveld refinement technique. Both complexes crystallized in a monoclinic lattice, space group-C2/c(15). The unit-cell parameters are a=28.917(3) Å; b=7.000(2) Å; c=17.550(4) Å; β=106.869(1) (1) for C36H32CuN6S2 and a=29.126(6) Å; b=7.042(4) Å; c=17.228(2) Å; β=105.587(2) for C36H32CuN6Se2. Analysis of the copper and selenium K-edge X-ray absorption spectra (EXAFS) of these complexes show that a copper atom is in pseudo-tetrahedric ligand environment N2X2 with typical Cu–N bonds (R=2.00–2.01 Å) and significantly different Cu–S and Cu–Se bonds (R=2.27 Å and R=2.41 Å, respectively) because of different sulfur and selenium ion radii. © 2004 International Centre for Diffraction Data.

Mixed lead chloride oxalate, Pb2Cl2(C2O4), has been obtained in a polycrystalline form in the course of a study on precursors of nanocrystalline PZT-type oxides. Its crystal structure has been solved ab initio from powder diffraction data collected using a monochromatic radiation from a conventional X-ray source. The symmetry is monoclinic, space group C2/m, the cell dimensions are a=5.9411(3) Å, b=5.8714(4) Å, c=9.4212(4) Å, β=95.232(4)° and Z=2. The structure consists of a stacking of complex double sheets, built from lead polyhedra, parallel to (001) and connected together through oxalate groups. The lead atom is nine-fold coordinated by four O atoms from one bidentate and two monodentate oxalate groups and five Cl atoms. The polyhedron can be described as a highly distorted square antiprism mono-capped by a Cl atom. The thermal behavior of lead chloride oxalate, in vacuum and in air, is carefully described from temperature-dependent powder diffraction and thermogravimetric measurements. It is shown that reaction pathways are complicated by the identification of various oxide chloride phases.

X-ray powder diffraction data for the anticancer drug PtCl2(C2H3O2)2(C6H13N)(NH3) are reported. The crystal structure of PtCl2(C2H3O2)2(C6H13N)(NH3) obtained from a Rietveld refinement are: space group P21/a, a=13.547(2) Å, b=8.260(1) Å, c=14.638(3) Å, β=110.429(2)°, V=1534.96 Å3, Z=4 and Dcalc.=2.068 Mg/m3.

AFeTi(PO4)3 (A=Ca,Cd) materials were obtained by solid state reaction in air at 1000 °C. Structures of the two compounds were determined from X-ray diffraction data using Rietveld analysis. Both phases exhibit the Nasicon-type structure (R3¯c space group) with a statistical Fe(Ti) distribution within the framework. Their hexagonal cell parameters are a=8.518(1) Å, c=21.797(2) Å and a=8.534(1) Å, c=21.416(2) Å, for CaFeTi(PO4)3 and CdFeTi(PO4)3, respectively. Cd atoms occupy the M1 site in CdFeTi(PO4)3. From XRD data, it is difficult to distinguish without ambiguity between Ca2+ and Ti4+ ions in CaFeTi(PO4)3. Nevertheless from the cation–anion distance found after the structure determination, Ca2+ distribution within the M1 site of Nasicon structure are validated.

Ten fragments of bronze age frescoes from the Greek group of volcanic islands known as Santorini have been examined by powder X-ray diffraction. A qualitative phase analysis based on line positions only was supplemented by the Rietveld method which uses complete diffraction profiles to increase the credibility of the phase analysis.

An X-Ray powder diffraction study of ultra-dispersed polytetrafluoroethylene was carried out. As well as a regular polytetrafluoroethylene the ultra-dispersed form contents a high proportion of the crystalline phase. The X-ray diffraction pattern could be described with two-dimensional hexagonal unit cell [a=5.685(1) Å, symmetry group p6mm]. Structural modeling with a continuous electron density approach as well as with a discrete disordered atoms distribution was accomplished. The model was refined using the Rietveld method. The structure is characterized by a spiral arrangement of polymers (CF2-)n along the z-axis with complete mutual disordering by rotational displacement around z, as well as a partial molecular translation along the z-axis. Molecular disordering results in a systematic absence of reflections with 1≠0 and as a sequence in two-dimensional unit cell effect. The presence of complete rotational disordering distinguishes the ultra-dispersed form of polytetrafluoroethylene from the standard one (fluoroplast-4), where only partial disordering is observed.

Rietveld refinement of LixCoO2-type cathodes (where x=0.59–1.00) has been demonstrated to yield quantitative information about the Li occupancy with an error of about ∼10%. With careful X-ray diffraction (XRD) data collection, refinement, and proper calibration, accurate values can be obtained. Rietveld refinement tends to under-predict the Li occupancy values in charged (de-lithiated) cathodes as compared to ICP measurements. A Li-gradient model that assumes a decreasing concentration of Li from the particle core to its surface is discussed to explain this observation. The observed lattice parameters for the fully lithiated LiCoO2 standard phase (R-3m symmetry) were a=2.8155(1) Å, c=14.052(1) Å. The error convention used in this paper is 3σ of standard deviations obtained from Rietveld refinement output.

The sin2ψ method can be formulated as a single system of simultaneous linear equations. Using this it is easy to show that the sin2ψ method is not a least-squares method. It further helps to compare the accuracies of the stress tensors obtained by the sin2ψ method and the method of least squares. Quantitative comparisons have been made for different fictitious measurements. It is shown that the unnecessary loss in accuracy by using the sin2ψ method is quite significant and by no means negligible. The same course of action has been applied to compare the so-called Dölle-Hauk method with a least-squares method; the result is similar. Some other methods for X-ray stress determination, most often similar to the sin2ψ method, and their shortcomings are also discussed briefly, together with the corresponding, more effective and more versatile least-squares method.