The crystal structures of some nickel hexacyanoferrates (II, III), including mixed compositions containing Na+, K+ and Cs+, were resolved and refined from XRD powder patterns. Data from infrared, Mössbauer and adsorption techniques provided complementary structural information. The crystal structures of Ni3[Fe(CN)6]2⋅16H2O and NiCs2[Fe(CN)6] were refined in space group Fm3m. NiNa2[Fe(CN)6]⋅2H2O and NiK2[Fe(CN)6]⋅2H2O were found to be orthorhombic (space group Pmn21). This structure (Pmn21) results from a distortion around the alkali ion, which appears as a monohydrated interstitial species. On ionic exchange in an aqueous solution containing Cs+, the orthorhombic distortion disappears and the cubic cell is obtained. Cs+ is a large cation and space is not available for interstitial water molecules. This orthorhombic model is also supported by the Mössbauer spectra of the ferrous analogs, FeK2[Fe(CN)6]⋅xH2O and Fe[Pt(CN)6]. © 2004 International Centre for Diffraction Data.

Using X-ray grazing incidence diffraction (GID) it is possible to perform a nondestructive analysis of the heterogeneous stress field for different volumes below the surface of the sample. The stress can be measured at very small depths, of the order of a few μm. The penetration depth of radiation is almost constant in a wide 2θ range for a given incidence angle α. It can be easily changed by an appropriate selection of α angle (or also by using a different type of radiation). There are, however, some factors which have to be corrected in this technique. The most important is the refraction of X-ray wave: it changes the wavelength and direction of the beam. Both effects modify a pick position. A corresponding correction was calculated and tested on ferrite powder and on 316L austenite stainless steel sample.

This study is about the structural properties of SiGe and SiGe:C heteroepitaxial layers on Si (001). The structural characterization is based on the application of complementary information content of X-ray scattering techniques like high-resolution X-ray diffraction (XRD), X-ray reflectivity (XRR), and X-ray diffuse scattering (XDS). One main focus of the analysis is to derive a sample model that sufficiently describes all experimental datasets. In addition, the reliability of parameters extracted by just one single method is discussed. It turned out that XRR is more sensitive to the near surface region, indicating the presence of surface roughness and density gradients that do not significantly affect the XRD pattern.

Silver halide based photographic imaging elements have been utilized as detectors for X-rays for over 100 years. These elements comprised of gelatin dispersed silver halide coated on one or both sides of a support, have been utilized in diffraction experiments since the discovery of X-ray diffraction by Laue and co-workers. X-ray film has high spatial resolution and can be adapted to flat or curved two-dimensional detection geometries. This paper describes the use of X-ray film as a two-dimensional detector for X-ray diffraction analysis, and discusses X-ray film composition, exposure, and processing, along with considerations for analyzing X-ray diffraction data collected using X-ray film.

Zn7Sb2O12 is known to adopt an inverse spinel crystal structure, in which Zn2+ occupies the eight tetrahedral positions and Sb5+ and Zn2+ randomly occupy the 16 octahedral positions. Samples of Zn7−xNixSb2O12 (x=0, 1, 2, 3, and 4) were synthesized using a modified polymeric precursor method, known as the Pechini method. The crystal structure of the powders was characterized by Rietveld refinement with X-ray diffraction data. The results show that for x=0, 1, and 2 Ni substitutes for Zn2+ in the octahedral sites, and that for x=3 and 4 it is assumed that Ni2+ replaces Zn2+ ions in both the octahedral and tetrahedral positions. It is also observed for x=3 and 4 the formation of two spinel phases.

The identification of crystallographic phases in the scanning electron microscope (SEM) has been limited by the lack of a simple way to obtain electron diffraction data of an unknown while observing the microstructure of the specimen. With the development of charge coupled device (CCD)-based detectors, backscattered electron Kikuchi patterns, alternately referred to as electron backscattered diffraction (EBSD) patterns, can be easily collected. Previously, EBSD has been limited to crystallographic orientation studies due to the poor pattern quality collected with video rate detector systems. With CCD detectors, a typical EBSD can now be acquired from a micron or submicron sized crystal using an exposure time of 1–10 s with an accelerating voltage of 10–40 kV and a beam current as low as 0.1 nA. Crystallographic phase analysis using EBSD is unique in that the properly equipped SEM permits high magnification images, EBSDs, and elemental information to be collected from bulk specimens. EBSD in the SEM has numerous advantages over other electron beam-based crystallographic techniques. The large angular view (∼70°) provided by EBSD and the ease of specimen preparation are distinct advantages of the technique. No sample preparation beyond what is commonly used for SEM specimens is required for EBSD.

The Rietveld method can be combined with the addition method to determine the absolute quantities of the phases treated by Rietveld refinement plus the quantity of phase(s) not treated by it (amorphous or unobserved). If q is the added proportion of a defined phase already present in the sample, and a1 and a2 its relative proportions as determined by Rietveld refinement prior and after the addition, the proportion of the amorphous (untreated) phase(s) in the original sample is calculated as xo=[a2−(1−q)a1−q]/(1−q)(a2−a1). The absolute quantities of the phases treated by Rietveld refinement are then determined by a correction for the content of the amorphous phase(s), or they can be calculated directly from specific equations. The advantage of the method is that no new variables are introduced in the refinement when the added standard already is a part of the original mixture.

The local variation in strain and rotation of the Si substrate due to overlying Ni thin film features has been observed using X-ray microdiffraction. Residual tensile stress in 1 μm thick, 190 μm diameter Ni dots of 990 MPa imparted an average compressive stress in the underlying Si substrate. Ni Kα fluorescence scans, acquired simultaneously with Si (333) diffraction data, allow for a precise determination of the Ni feature edge location relative to the observed shift in Si (333) peak position. Rocking curve mesh scans, in which the sample was translated perpendicular and parallel to the diffraction plane, were used to deconvolute the effects of substrate strain due to d-spacing shifts and rotation of the local Si surface. In addition, shear strains at the dot edge imparted a significant shift in the Si (333) diffraction peak, producing a secondary diffraction peak in modified reciprocal space scans.

A modified method for polynomial smoothing and the calculation of derivatives of equally spaced step scan powder diffraction data is presented. The algorithm takes the angular dependence of the full width at half maximum (FWHM) of diffraction peaks into account, is very effective, and easy to code.

The crystal structures of Sr2MgWO6 and Ba2SrWO6 compounds, studied by powder X-ray diffraction, were found to be distorted perovskites with a complete NaCl type ordering between Mg2+/W6+ and Sr2+/W6+ ions, respectively. The unit cells are characterized by the tetragonal (space group I4/m; a0a0a−) symmetry, with the parameters a=5.5849(10) Å and c=7.9455(10) Å, for Sr2MgWO6 and triclinic (space group F-1; a−b−b−) symmetry, with the parameters a=8.5409(10) Å, b=c=8.5860(10) Å, α=89.35(1)° and β=γ=90.31(1)°, for Ba2SrWO6. © 2004 International Centre for Diffraction Data.