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Using a standard laboratory X-ray powder diffractometer under very stable environmental conditions, it has been found that measurements of the positions and heights of sharp diffraction maxima can be made with a precision of order 2 × 10 −4° in 2θ and 0.1% in height (for ∼ 2 × 105 counts per point at the peak). Under normal conditions, however, displacements of order 0.02° in 2θ and 3% in height are observed. These shifts have been attributed to changes in the diffraction geometry, in particular the sourcedivergence slit configuration, brought about by changes in ambient temperature and by changes in the temperature of the liquid used to cool the X-ray tube.
Indexed powder diffraction data for Lu(OH)3 are reported. The compound is cubic, Im3(No. 204), with a = 8.2221(3)Å, V = 555.84Å3, Z = 8, Dm = 5.36(4)Mg m−3 (Dx = 5.40Mg m−3). The refined cell parameter was determined by employing a Siemens Debye-Scherrer camera (Cu radiation, Ni filter). The indexed data were evaluated according to the quantitative figures of merit FN and M20 (F29 = 20(0.028,51) and M20 = 43.5). A thermal gravimetric analysis is presented. The JCPD S Diffraction File No. for Lu(OH)3 is 38–1500.
Tabular untwinned crystals of colorless transparent armstrongite from the Strange Lake Alkalic Complex, on the Quebec – Labrador boundary, Canada are monoclinic, space group choices I2/m, I2, Im (diffraction aspect I*/*), with refined unit-cell parameters a = 13.599 (9), b = 14.114(9), c = 7.833 (4) Å, β = 103.41 (5)°, V = 1462.4 (±3.0) Å3. a:b:c = 0.9635:1:0.5550, Z = 4 and D(x) = 2.696 g/cm3. A fully indexed X-ray powder pattern is presented. Averaged electron-microprobe analyses suggest a theoretical formula of CaZrSi6O15 · 3 H2O. The Strange Lake armstrongite is biaxial negative, α = 1.567 (1), β = 1.576 (1), γ = 1.577 (1), 2V (meas.) = 39 (1)°, 2V (calc.) = 37°, Z∥b, X Λc = +4°, with no absorption and weak dispersion r < v.
The structure of a birefringent andradite–grossular sample was refined using single-crystal X-ray diffraction (SCD) and synchrotron high-resolution powder X-ray diffraction (HRPXRD) data. Electron-microprobe results indicate a homogeneous composition of {Ca2.88Mn2+0.06Mg0.04Fe2+0.03}Σ3[Fe3+1.29Al0.49Ti4+0.17Fe2+0.06] Σ2(Si2.89Al0.11) Σ3O12. The Rietveld refinement reduced χ2 = 1.384 and overall R (F2) = 0.0315. The HRPXRD data show that the sample contains three phases. For phase-1, the weight %, unit-cell parameter (Å), distances (Å), and site occupancy factor (sof) are 62.85(7)%, a = 12.000 06(2), average <Ca–O> = 2.4196, Fe–O = 1.9882(5), Si–O = 1.6542(6) Å, Ca(sof) = 0.970(2), Fe(sof) = 0.763(1), and Si(sof) = 0.954(2). The corresponding data for phase-2 are 19.14(9)%, a = 12.049 51(2), average <Ca–O> = 2.427, Fe–O = 1.999(1), Si–O = 1.665(1) Å, Ca(sof) = 0.928(4), Fe(sof) = 0.825(3), and Si(sof) = 0.964(4). The corresponding data for phase-3 are 18.01(9)%, a = 12.019 68(3), average <Ca–O> = 2.424, Fe–O = 1.992(2), Si–O = 1.658(2) Å, Ca(sof) = 0.896(5), Fe(sof) = 0.754(4), and Si(sof) = 0.936(5). The fine-scale coexistence of the three phases causes strain that arises from the unit-cell and bond distances differences, and gives rise to strain-induced birefringence. The results from the SCD are similar to the dominant phase-1 obtained by the HRPXRD, but the SCD misses the minor phases.
Two molybdates MIV (MoO4)2 (with MIV = Hf or Zr) were synthesized by solid state reaction between MIVO2 and MoO3. Zirconium molybdate undergoes a reversible phase transition at 952 K.
Hf(MoO4)2 and H.T. Zr(MoQ4)2, obtained as single crystals, are trigonal, space group with Z = 6; the cell dimensions are respectively a = 10.1005(3), c = 11.7230(5)Å; V = 1035.76(11)Å3; Dm(298 K) = 4.78(4), Dx = 4.792 Mg m−3 and a = 10.1409(3), c = 11.7097(5)Å; V = 1042.88(11)Å3; Dm (298 K) = 3.91(4), Dx = 3.926 Mg m−3.
L.T. Zr(MoO4)2, indexed by the Visser automatic indexing program (1969) was found to be monoclinic, possible space group P2, P21 or Pm with Z = 4; the cell dimensions are a = 9.7557(5), b = 7.9373(5), c = 7.4631(4)Å, β = 97.959°(5); V = 572.3(5)Å Dm(298 K) = 4.74(5), Dx = 4.770 Mg m−3. Powder diffraction data were obtained at 293 K on a counter diffractometer with Ni-filtered copper radiation ( = 1.5418 Å).
The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards. The patterns are a continuation of the series of standard X-ray diffraction powder patterns published previously in the NBS Circular 539, the NBS Monograph 25, and in this journal. The methods of producing these reference patterns are described in this journal, Vol. 1, No. 1, p. 40 (1986).
The data for each phase apply to the specific sample described. A sample was mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2-theta values for these standards are specified in the methods described (ibid.). Data, from which the reported 2-theta values were determined, were measured with a computer controlled diffractometer. Computer programs were used to locate peak positions and calibrate the patterns as well as to perform variable indexing and least squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.
A headlamp of a vehicle involved in an accident was examined in order to assess whether or not it was lit during the collision. In the examination it was found that the headlamp bulb was heavily blackened in an unusual way and its two filaments burnt out. Applying X-ray powder diffraction by diffractometer, the black deposit present in the bulb was identified to consist of a mixture of β-tungsten and the ordinary α-tungsten.
Vertically aligned graphene was grown by plasma-enhanced chemical vapor deposition using methane feedstock. Optical emission spectroscopy (OES) was used to monitor the plasma species, and Raman spectroscopy was used for characterizing the properties of as-grown vertically aligned graphene. OES-derived information on plasma species, such as C, C2, CH, and H, are correlated with the properties of the vertically aligned graphene. Graphene grown at 250 W and 15 sccm exhibited the lowest amount of defects. Although OES peak intensities occurred at the highest power and lowest flow conditions, the OES peak ratios of plasma species had a greater dependence on flow rate and exhibited a saddle point in the atomic C/H ratio corresponding to optimal growth involving the lowest amount of overall defects. Plasma diagnostics provides a valuable approach to optimize growth characteristics and material properties.
Novel europium- and gadolinium-doped bismuth phosphate (Eu/BiPO4 and Gd/BiPO4) microcrystals have been synthesized by a hydrothermal route. The morphologies and optical properties of the as-prepared samples were characterized carefully. Their photocatalytic activities were determined by oxidative decomposition of methylene blue (MB) in aqueous solution. The results revealed that europium and gadolinium doping greatly improves the photocatalytic efficiency of BiPO4 microcrystals. Among these as-prepared europium and gadolinium dopant samples, 1% Eu/BiPO4 and 5% Gd/BiPO4 displayed the highest photocatalytic activity, and the degradation rates are 2 and 2.7 times greater than pure BiPO4, respectively. The photodegradation reactions of MB by Eu- and Gd-BiPO4 followed first-order kinetics. The different photocatalytic mechanisms of Eu/BiPO4 and Gd/BiPO4 photocatalysts are discussed.
Lead-free positive temperature coefficient of resistance (PTC) thermistors were synthesized from (1 − x/100)BaTiO3–(x/100)(Bi1/2K1/2)TiO3-based solid solutions, using a conventional mixed-oxide fabrication route, and sintered in N2 followed by air annealing. A maximum TC of 205 °C was achieved for x = 20. An increase in x from 0 to 20 decreased the grain size by more than 92% and increased room temperature resistivity (ρRT) by 7 orders of magnitude. For x ≤ 10, PTC ratio (ρmax/ρmin) ≈ 104.5 and temperature coefficient of resistivity (α) > 10.3%/°C were achieved using Mn and Al2O3:SiO2:TiO2 (AST) additions. For x > 10, ρmax/ρmin > 103 and α > 8%/°C were only obtained in samples sintered in N2 without subsequent air annealing. Complex impedance analysis revealed three relaxation processes, attributed to a semiconducting grain core, a PTC active grain boundary interface, and a grain boundary insulating layer. Local electrical activity was investigated by hot-stage conductive mode microscopy. The existence of symmetrical grain boundary electron beam-induced current and β-conductivity contrast at the grain boundaries, consistent with the presence of an electron trapping two-dimensional grain boundary plane, compensated by positive space charge layers and a low conductivity vacancy-rich layer, was revealed for the first time within this system.